Radio frequency identification (RFID) is an exciting multidisciplinary field with numerous applications. The 2015 IEEE International Conference on RFID is the premier conference for exchanging all technical research in RFID. The conference attendance boasts an outstanding mix of practitioners and researchers from industry and academia. IEEE RFID 2015 is an opportunity to share, discuss, and witness research results in all areas of RFID technologies and their applications.
The 2015 IEEE International Conference on RFID is seeking original, high-impact research papers on RFID-related topics. Papers will be selected based on originality, importance of the problem, technical merit, clarity, and the potential impact of the results. Accepted and presented papers will be published in the IEEE RFID 2015 conference proceedings and submitted for inclusion in IEEE Xplore®. Accepted papers will also be submitted for indexing through EI Compendex, ScienceDirect, Scopus, Web of Knowledge, Thomson ISI, and IET Inspec.
- (NEW FOR 2015) Internet of Things (IoT): RFID provisioning and lost connection handling, RFID networking standards, communications standards, RFID-enabled devices, ubiquitous tracking and positioning, IoT/RFID system architectures
- Antennas & Propagation: MIMO and diversity techniques, Antenna theory and designs, channel measurements and modeling, ultra-wideband backscattering, hybrid ultra-wideband RFID tags and interrogators
- Applications & Software: RFID software, middleware, network applications, scientific studies on operational experience of RFID applications, unconventional RF “identification”
- Circuits, Devices, & Interrogators: Circuit designs, non-silicon and chipless RFID, interrogator architecture, multi-interrogator coordination and interference reduction
- Energy Harvesting and Wireless Power: Ambient RF harvesting, efficiency improvements, power-optimized waveforms, RFID tags using kinetic, thermal, or optical power-harvesting
- Localization: Performance bounds, novel system approaches, technologies, and algorithms in RFID tag and reader localization, RF Tomography and Environmental Sensing
- Protocols & Security: Coding, anti-collision, cryptography and privacy-enhancing techniques, medium/multiple access schemes
- Sensors: Integration of sensors with RFID tags, including active, passive, or chipless mechanisms; RFID sensor modeling and analysis, new sensors for RFID
If your topic does not fit one of the above groups or are unsure which topic to select, please contact the Technical Program Chair here.
- Paper submissions due:
December 19, 2014January 2, 2015
- Workshop proposals due: January 26, 2015
- Notifications of acceptance: February 13, 2015
- Publication-ready version due: March 11, 2015
- Conference: April 15-17, 2015 @ San Diego Convention Center, San Diego, CA
IEEE RFID 2015 accepts papers of up to 8 pages in length, formatted in the IEEE conference style. Papers will be reviewed in a double-blind review process and submitted for inclusion in IEEE Xplore® if accepted and presented at the conference. Submissions must be original and may not be under consideration elsewhere. IEEE RFID will not tolerate scholarly misconduct in any form. Cases of multiple publications and plagiarism will be handled according to IEEE policies and procedures.
IEEE RFID 2015’s poster session will once again provide researchers around the world with the opportunity to cover preliminary or exploratory work within RFID research. More detailed information is available here.
Technical Program Committee
Alanson Sample (USA), Disney Research
Antennas and Propagation: Pavel Nikitin (USA), Intermec Technologies
Applications and Software: Damith Ranasinghe (Australia), University of Adelaide
Circuits, Devices, and Interrogators: Josef Preishuber-Pfluegl (Austria), CISC Semiconductor
Next-Generation Physical Layer: Joshua Griffin (USA), Northwest Nazarene University
Localization: Daniel Arnitz (USA), University of Washington
Power Harvesting: Joshua Smith (USA), University of Washington
Protocols and Security: Peter Hawrylak (USA), University of Tulsa
Sensors: Jin Mitsugi (Japan), Keio University
IEEE RFID 2015 General Chair:
Matt Reynolds (USA), University of Washington